NbCu3Se4

semiconductor
· NbCu3Se4

NbCu3Se4 is a ternary semiconductor compound combining niobium, copper, and selenium in a fixed stoichiometric ratio. This material belongs to the family of mixed-metal chalcogenides and is primarily of research interest rather than established industrial production; it is being investigated for potential applications in thermoelectric devices, photovoltaics, and advanced electronic materials due to the favorable electronic properties that emerge from its multi-element composition. The combination of transition metals (Nb, Cu) with a chalcogen (Se) creates a material system with tunable band structure and potential for efficient charge transport, making it relevant to engineers exploring next-generation energy conversion and semiconductor technologies.

thermoelectric devicesphotovoltaic researchsemiconductor electronicsenergy harvestingadvanced materials R&Dexperimental thin films

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)2 entries
4,810.6
ksi
5,380.9
ksi
Poisson's Ratio(ν)
0.2400
-
Shear Modulus(G)2 entries
3,244.4
ksi
3,420
ksi
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
0.1957
lb/in³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
2.450
eV
1.344
eV
Dielectric Constant (Relative Permittivity)(εr)3 entries
7.740
-
7.897
-
8.138
range 8.012–8.264median of 2 measurements
-
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-
Total Dielectric Tensor(ε)
Matrix (redacted)
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)2 entries
0.01909
C/m²
0.1188
C/m²
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²
Seebeck Coefficient(S)
-275.3
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.000
eV/atom
Formation Energy(ΔHf)
-0.4946
eV/atom
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.