NaNO2

semiconductor
· NaNO2

Sodium nitrite (NaNO₂) is an inorganic ionic compound classified as a semiconductor material, consisting of sodium and nitrite ions in a crystalline lattice structure. While traditionally known as a food preservative and industrial chemical, NaNO₂ has emerged in materials research for potential applications in energy storage, ionic conductivity studies, and solid-state electrochemistry, where its layered crystal structure and moderate mechanical properties make it a candidate for investigating ion transport phenomena and battery electrolyte materials. Engineers considering this material should recognize it primarily as a specialty chemical rather than a structural or high-performance engineering material, though its semiconductor behavior presents research opportunities in niche electrochemical applications.

Ionic conductivity researchSolid-state battery developmentElectrochemical storage systemsIon-selective materialsExperimental semiconductor devicesSalt-based electrolyte systems

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
Units:
siimperial
PropertyValueUnitConditionsSource
Bulk Modulus(K)
32.71
GPa—
Exfoliation Energy(Eexf)
199.2
meV/atom—
Poisson's Ratio(ν)
0.3200
-—
Shear Modulus(G)
14.75
GPa—
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
2.184
kg/m³—
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
3.020
eV—
↳
2.414
eV—
Dielectric Constant (Relative Permittivity)(εr)3 entries
5.270
-—
↳
6.203
-—
↳
3.707
range 2.277–5.138median of 2 measurements
-—
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-—
Total Dielectric Tensor(ε)
Matrix (redacted)
-—
Magnetic Moment(μB)
0.000
µB—
Piezoelectric Modulus(eij)2 entries
0.07468
C/m²—
↳
0.7128
C/m²—
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²—
Seebeck Coefficient(S)
-394.7
µV/K—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.00890
eV/atom—
Formation Energy(ΔHf)
-0.9565
eV/atom—
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.