LiMgN
semiconductor· LiMgN
LiMgN is a ternary nitride semiconductor compound combining lithium, magnesium, and nitrogen. This material remains largely in the research and development phase, explored for wide-bandgap semiconductor applications where its light-element composition and nitride chemistry offer potential advantages in optoelectronic and high-temperature device environments. The material family shares characteristics with other III-V and II-VI nitrides, positioning it as a candidate for next-generation wide-bandgap electronics where conventional semiconductors reach performance limits.
wide-bandgap semiconductors (research)high-temperature electronicsoptoelectronic devices (exploratory)UV/deep-UV light emissionpower electronics (advanced development)neutron detection materials (potential)
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 13,853.3 | ksi | — | ||
| ↳ | 14,609.7 | ksi | — | ||
Poisson's Ratio(ν) | 0.1800 | - | — | ||
Shear Modulus(G)2 entries | 11,477 | ksi | — | ||
| ↳ | 12,365.9 | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.08692 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.200 | eV | — | ||
| ↳ | 2.603 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 10.71 | - | — | ||
| ↳ | 10.25 | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.2366 | C/m² | — | ||
| ↳ | 0.1346 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -166.9 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.00270 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.8376 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.