LiMgBi
semiconductor· LiMgBi
LiMgBi is an experimental ternary semiconductor compound combining lithium, magnesium, and bismuth. This material belongs to the family of half-Heusler and related intermetallic semiconductors under active research for thermoelectric and optoelectronic applications. While not yet in mainstream commercial use, LiMgBi represents the broader class of lightweight metal-bismuth compounds being investigated for next-generation energy conversion and quantum material platforms where conventional semiconductors face limitations.
Thermoelectric devices (research)Topological quantum materialsHigh-temperature semiconductor applicationsEnergy harvesting systems (development)Optoelectronic components (experimental)Advanced material research platforms
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 4,533.8 | ksi | — | ||
| ↳ | 4,674.6 | ksi | — | ||
Poisson's Ratio(ν) | 0.2200 | - | — | ||
Shear Modulus(G)2 entries | 3,079.3 | ksi | — | ||
| ↳ | 3,248.8 | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1823 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 0.4000 | eV | — | ||
| ↳ | 0.5340 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 25.05 | - | — | ||
| ↳ | 20.94 | - | — | ||
| ↳ | 25.66 range 23.23–28.09median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.01592 | C/m² | — | ||
| ↳ | 0.2860 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -76.06 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.4803 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.