K2SiP2
ceramic· K2SiP2
K2SiP2 is an inorganic ceramic compound composed of potassium, silicon, and phosphorus elements. This material belongs to the family of phosphosilicate ceramics and appears to be primarily of research or specialized interest rather than a mainstream engineering commodity. While the broader phosphosilicate ceramic family has been explored for applications requiring thermal stability, chemical inertness, and structural rigidity, K2SiP2 specifically remains uncommon in published industrial applications, making it most relevant for researchers developing advanced ceramics, composite matrices, or niche functional materials where its particular composition offers benefits over conventional silicate or phosphate ceramics.
advanced research ceramicscomposite matrix materialsphosphosilicate compoundsspecialized refractory applicationsfunctional ceramic development
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 28.68 | GPa | — | ||
Poisson's Ratio(ν) | 0.3000 | - | — | ||
Shear Modulus(G) | 15.71 | GPa | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 2.063 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 1.261 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 10.27 | - | — | ||
| ↳ | 7.881 range 5.665–10.10median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Seebeck Coefficient(S) | -238.2 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.5593 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.