K2SiAs2
ceramic· K2SiAs2
K2SiAs2 is an inorganic ceramic compound containing potassium, silicon, and arsenic elements, belonging to the silicate/arsenide ceramic family. This material is primarily of research and experimental interest rather than established industrial production, studied for its potential in semiconductor applications, optical materials, and specialized refractory ceramics where arsenic-bearing compositions offer unique electronic or thermal properties. Engineers would consider K2SiAs2 in niche applications requiring arsenic-doped ceramics, though its use remains limited to laboratory development and feasibility studies rather than mainstream engineering practice.
experimental semiconductorsoptical ceramics researchrefractory materials developmentarsenic-bearing compoundssolid-state chemistry applications
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 3,581 | ksi | — | ||
Poisson's Ratio(ν) | 0.3100 | - | — | ||
Shear Modulus(G) | 1,950.8 | ksi | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1038 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 1.092 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 11.18 | - | — | ||
| ↳ | 8.733 range 6.513–10.95median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Seebeck Coefficient(S) | -274.7 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.4959 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.