InS
semiconductor· InS
Indium sulfide (InS) is a III-VI direct bandgap semiconductor compound used primarily in optoelectronic and photovoltaic device research. It appears as a layered material with moderate mechanical stiffness and notably low exfoliation energy, making it amenable to exfoliation into thin-film or two-dimensional forms for advanced device applications. InS is of particular interest in emerging areas such as thin-film solar cells, photodetectors, and next-generation electronics where its bandgap properties and layer-dependent characteristics offer advantages over conventional semiconductors.
thin-film photovoltaicsphotodetectors and optoelectronics2D material researchinfrared opticsemerging semiconductor devices
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 5,531.7 | ksi | — | ||
Exfoliation Energy(Eexf) | 250.8 | meV/atom | — | ||
Poisson's Ratio(ν) | 0.2400 | - | — | ||
Shear Modulus(G) | 3,435.9 | ksi | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1807 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 2.070 | eV | — | ||
| ↳ | 1.037 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 15.16 | - | — | ||
| ↳ | 20.91 | - | — | ||
| ↳ | 14.75 range 10.59–18.91median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -137.8 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -0.6939 | eV/atom | — | ||
| ↳ | -0.5840 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.