Indium phosphide (InP) is a III-V direct-bandgap semiconductor compound used in high-speed optoelectronic and microwave applications where superior electron mobility and direct bandgap properties are required. It is the material of choice for high-frequency integrated circuits, infrared LEDs, photodetectors, and long-wavelength fiber-optic communications (particularly 1.3–1.55 μm window), where its performance advantages over silicon and GaAs become critical for speed and efficiency. Engineers select InP when conventional semiconductors cannot meet bandwidth, frequency, or spectral requirements, though its higher cost and greater brittleness than silicon limit adoption to performance-critical niches.
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| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 8,658.8 | ksi | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.2800 | - | DFT · OptB88vdW | ||
Shear Modulus(G) | 4,647 | ksi | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Thermal Conductivity(k) | 49.23 | BTU/(hr·ft·°F) | Measured |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1656 | lb/in³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 1.500 | eV | Measured | ||
| ↳ | 0.3310 | eV | DFT · OptB88vdW | ||
| ↳ | 1.387 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 38.38 | - | DFT · OptB88vdW | ||
| ↳ | 18.26 range 16.73–19.78median of 2 measurements | - | DFT · PBEsol | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 23.59 | - | DFT · OptB88vdW | ||
| ↳ | 8.039 | - | DFT · TBmBJ | ||
Electron Effective Mass(m*e) | 0.05000 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 0.1400 | me | DFT · OptB88vdW · 27°C | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij)2 entries | 1.010 | C/m² | DFT · OptB88vdW | ||
| ↳ | 0.05705 | C/m² | DFT · PBE | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | DFT · PBE | ||
Thermoelectric Power Factor(PF)2 entries | 0.000146 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00320 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -29.47 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 259.2 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 33.85 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf)2 entries | -0.2243 | eV/atom | DFT · OptB88vdW | ||
| ↳ | -0.3902 | eV/atom | Measured |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data