InOF2 — Properties & Data | MatWorld

InOF2

ceramic

· JVASP-79618· InOF2

InOF2 is an indium oxide fluoride ceramic compound combining ionic bonding characteristics typical of metal oxides with the chemical influence of fluorine, producing a dense crystalline material. This is a research-phase compound rather than an established commercial ceramic; it belongs to the family of mixed-anion oxyfluorides, which are of interest for advanced electronic, optical, and structural applications where conventional oxides fall short. InOF2 and related indium-based oxyfluorides are being explored in materials science for potential use in solid-state ionics, photonic devices, and high-performance refractory applications where fluorine incorporation can modify thermal stability, ionic conductivity, or optical transparency.

solid-state ionic conductorsoptical coating researchadvanced refractory ceramicsphotonic material developmentelectronic substrate researchfluoride-based compound matrices

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions
Bulk Modulus(K)	18,899.9	ksi	DFT · OptB88vdW
Poisson's Ratio(ν)	-0.1100	-	DFT · OptB88vdW
Shear Modulus(G)	4,190.1	ksi	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.1701	lb/in³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Filter by

Method

Property	Value	Unit	Conditions
Band Gap(Eg)2 entries	0.4200	eV	DFT · OptB88vdW
↳	4.444	eV	DFT · TBmBJ
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries	4.074	-	DFT · OptB88vdW
↳	2.022	-	DFT · TBmBJ
Magnetic Moment(μB)	1.000	µB	DFT · OptB88vdW
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	0.000	%	DFT · TBmBJ

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.4547	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	-1.643	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

InOF2

Mechanical Properties

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

Environmental