InN

semiconductor
· InN

Indium nitride (InN) is a wide-bandgap III-V semiconductor compound with a hexagonal wurtzite crystal structure, belonging to the nitride family alongside GaN and AlN. It is primarily used in high-frequency and optoelectronic devices, particularly in RF power amplifiers, high-electron-mobility transistors (HEMTs), and emerging photovoltaic applications where its narrow bandgap (smaller than GaN) enables operation in the infrared spectrum. InN remains largely in research and early-stage commercialization phases compared to mature GaN technology, but its potential for tunable bandgap engineering in heterostructures and high-frequency applications at microwave and millimeter-wave frequencies makes it attractive for next-generation wireless and sensing systems.

RF power amplifiersHigh-electron-mobility transistors (HEMTs)Infrared optoelectronicsMillimeter-wave devicesResearch semiconductorsPhotovoltaic heterostructures

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)
126.3
GPa
Poisson's Ratio(ν)
0.3100
-
Shear Modulus(G)
53.84
GPa
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Thermal Conductivity(k)
105
W/(m·K)
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
6.695
kg/m³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
2.100
eV
0.3790
range 0.000–0.7580median of 2 measurements
eV
Dielectric Constant (Relative Permittivity)(εr)
198.7
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)2 entries
2.159
C/m²
0.9614
C/m²
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²
Seebeck Coefficient(S)
-34.01
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.01940
eV/atom
Formation Energy(ΔHf)2 entries
-0.7157
eV/atom
0.00906
eV/atom
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.