In2HgTe4
ceramic· In2HgTe4
In2HgTe4 is a quaternary semiconductor ceramic compound belonging to the II-VI semiconductor family, combining indium, mercury, and tellurium elements. This material is primarily investigated in research contexts for infrared detection and optoelectronic applications, where its narrow bandgap and high atomic number elements enable sensitivity in the mid- to far-infrared spectrum. Engineers consider this compound for specialized sensing and thermal imaging systems where conventional semiconductors are insufficient, though it remains less mature than established alternatives like HgCdTe and requires careful handling due to mercury toxicity.
infrared detectorsthermal imaging sensorsresearch optoelectronicssemiconductor devicescryogenic applicationsspectroscopy systems
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 2,874.8 | ksi | — | ||
Shear Modulus(G) | 1,759.1 | ksi | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2234 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 0.4040 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 24.16 | - | — | ||
| ↳ | 18.23 range 16.20–20.25median of 2 measurements | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.06826 | C/m² | — | ||
| ↳ | 0.5982 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -84.31 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.2213 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.