In2HgTe4 is a quaternary semiconductor ceramic compound belonging to the II-VI semiconductor family, combining indium, mercury, and tellurium elements. This material is primarily investigated in research contexts for infrared detection and optoelectronic applications, where its narrow bandgap and high atomic number elements enable sensitivity in the mid- to far-infrared spectrum. Engineers consider this compound for specialized sensing and thermal imaging systems where conventional semiconductors are insufficient, though it remains less mature than established alternatives like HgCdTe and requires careful handling due to mercury toxicity.
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| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 2,874.8 | ksi | DFT | ||
Shear Modulus(G) | 1,759.1 | ksi | DFT |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2234 | lb/in³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 0.4040 | eV | DFT · OptB88vdW | ||
| ↳ | 1.349 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 24.16 | - | DFT · OptB88vdW | ||
| ↳ | 18.23 range 16.20–20.25median of 2 measurements | - | DFT · PBEsol | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 15.87 | - | DFT · OptB88vdW | ||
| ↳ | 8.904 | - | DFT · TBmBJ | ||
Electron Effective Mass(m*e) | 0.09000 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 0.4433 | me | DFT · OptB88vdW · 27°C | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij)2 entries | 0.5982 | C/m² | DFT · OptB88vdW | ||
| ↳ | 0.06826 | C/m² | DFT · PBE | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | DFT · PBE | ||
Thermoelectric Power Factor(PF)2 entries | 0.000886 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00257 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -84.31 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 247.4 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 33.94 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf) | -0.2213 | eV/atom | DFT · OptB88vdW |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data