Hafnium disulfide (HfS2) is a layered transition metal dichalcogenide semiconductor with a hexagonal crystal structure, belonging to the family of two-dimensional materials that can be exfoliated into atomically thin sheets. Currently in the research and development phase, HfS2 is being investigated for next-generation nanoelectronics, optoelectronics, and energy storage applications where its tunable band gap and layered geometry offer advantages over conventional bulk semiconductors. Its potential appeal to engineers lies in enabling flexible electronics, high-sensitivity photodetectors, and battery/supercapacitor electrodes where ultrathin, mechanically compliant materials provide performance or integration benefits that silicon-based alternatives cannot match.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 46.27 | GPa | DFT · OptB88vdW | ||
Exfoliation Energy(Eexf) | 86.83 | meV/atom | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.2200 | - | DFT · OptB88vdW | ||
Shear Modulus(G) | 34.26 | GPa | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 5.985 | kg/m³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 1.078 | eV | DFT · OptB88vdW | ||
| ↳ | 1.684 | eV | DFT · TBmBJ | ||
| ↳ | 2.900 | eV | Measured | ||
Dielectric Constant (Relative Permittivity)(εr) | 43.26 | - | DFT · OptB88vdW | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 9.733 | - | DFT · OptB88vdW | ||
| ↳ | 8.281 | - | DFT · TBmBJ | ||
Electron Effective Mass(m*e) | 1.243 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 2.223 | me | DFT · OptB88vdW · 27°C | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | DFT · OptB88vdW | ||
Thermoelectric Power Factor(PF)2 entries | 0.00416 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00222 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -308.2 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 293 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 29.47 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf) | -1.705 | eV/atom | DFT · OptB88vdW |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data