HfO2
ceramic· HfO2
Hafnium dioxide (HfO2) is a refractory ceramic oxide with high density and strong elastic properties, widely used in applications demanding thermal stability and electrical functionality. It serves as a high-κ dielectric in advanced semiconductor gate stacks, thermal barrier coatings in gas turbines and aerospace engines, and crucible/liner material in high-temperature metallurgical processes. Engineers select HfO2 over alternatives like SiO2 or Al2O3 when extreme temperature resistance, superior dielectric performance, or enhanced radiation stability are critical requirements.
semiconductor gate dielectricsthermal barrier coatingshigh-temperature cruciblesnuclear fuel claddingoptical coatingsrefractory applications
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 204.6 | GPa | — | ||
| ↳ | 204.6 | GPa | — | ||
| ↳ | 235.4 | GPa | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.3858 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | Pa | — | ||
Poisson's Ratio(ν)2 entries | 0.2924 | - | — | ||
| ↳ | 0.2800 | - | — | ||
Shear Modulus(G)3 entries | 98.56 | GPa | — | ||
| ↳ | 98.56 | GPa | — | ||
| ↳ | 121.4 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 10.51 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 5.550 | eV | — | ||
| ↳ | 4.315 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 18.75 | - | — | ||
| ↳ | 35.32 | - | — | ||
| ↳ | 16.97 range 4.659–29.27median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 1.219 | C/m² | — | ||
| ↳ | 0.000 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -285.6 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.01180 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -3.861 | eV/atom | — | ||
| ↳ | -3.798 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.