HfO₂ (hafnium oxide) is a high-k ceramic compound belonging to the refractory oxide family, characterized by exceptional thermal stability and a wide bandgap. It is primarily used in advanced semiconductor gate dielectrics as a replacement for traditional SiO₂ in sub-28 nm CMOS technology nodes, where it enables continued device scaling while reducing gate leakage currents. The material is also explored for optical coatings, thermal barrier applications, and emerging high-temperature structural ceramics, making it notable for applications requiring both electrical performance and extreme thermal resistance.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 0.000 | eV | — | ||
Magnetic Moment(μB) | -0.0000163 | μB | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Formation Energy(ΔHf) | 0.5000 | eV/atom | — |