Hafnium tetrachloride (HfCl4) is an inorganic ceramic compound composed of hafnium and chlorine, belonging to the transition metal halide family. It is primarily used in laboratory and industrial synthesis as a precursor material for hafnium oxide coatings and high-refractive-index optical films, particularly in thin-film deposition processes like chemical vapor deposition (CVD) and atomic layer deposition (ALD). HfCl4 is valued in microelectronics and photonics applications where high-κ dielectric materials are required, though it is generally considered a chemical intermediate rather than an end-use structural material; engineers select it for its ability to produce high-purity hafnium compounds and its utility in creating advanced coatings on substrates where hafnium's exceptional thermal stability and optical properties are beneficial.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 2,171.2 | ksi | DFT · OptB88vdW | ||
Exfoliation Energy(Eexf) | 71.62 | meV/atom | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.2600 | - | DFT · OptB88vdW | ||
Shear Modulus(G) | 1,348.9 | ksi | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1426 | lb/in³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.912 | eV | DFT · OptB88vdW | ||
| ↳ | 5.003 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 8.678 | - | DFT · OptB88vdW | ||
| ↳ | 4.540 | - | DFT · PBE | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 4.021 | - | DFT · OptB88vdW | ||
| ↳ | 3.279 | - | DFT · TBmBJ | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | DFT · PBE | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | DFT · PBE | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | DFT · OptB88vdW | ||
Thermoelectric Power Factor(PF)2 entries | 0.000650 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00120 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -385.7 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 410.4 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 0.000 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf)2 entries | -1.877 | eV/atom | DFT · OptB88vdW | ||
| ↳ | -2.053 | eV/atom | Measured |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data