Hf2O4 (hafnium oxide) is a refractory ceramic compound belonging to the hafnia family of oxides, valued for its high thermal stability and wide bandgap semiconductor properties. This material is primarily investigated for advanced applications in microelectronics, photonics, and extreme-environment components, where its chemical inertness and structural rigidity make it attractive as a gate dielectric, optical coating, or thermal barrier in next-generation devices operating at elevated temperatures. As a research-phase material, Hf2O4 represents the hafnium oxide family's potential to enable miniaturization and performance improvements beyond conventional silicon dioxide and standard hafnia applications.
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| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 32,704.4 | ksi | — | ||
Shear Modulus(G) | 17,505 | ksi | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 3.950 | eV | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Formation Energy(ΔHf) | -3.771 | eV/atom | — |