GaN

semiconductor
· GaN

Gallium nitride (GaN) is a wide-bandgap semiconductor compound with a hexagonal crystal structure, widely used in high-power and high-frequency electronic devices. It is the enabling material for modern power electronics, RF amplifiers, and LED technology, chosen over silicon for applications requiring higher efficiency, faster switching speeds, and operation at elevated temperatures. GaN's superior performance in energy conversion and signal amplification has made it indispensable in renewable energy systems, telecommunications infrastructure, automotive electrification, and consumer electronics.

power conversion and switching devicesRF and microwave amplifiersLED lighting and displayselectric vehicle power electronicsrenewable energy invertershigh-frequency telecommunications

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)3 entries
209.3
GPa
171.7
GPa
178.7
GPa
Elastic Compliance Tensor(Sij)
Matrix (redacted)
1/GPa
Elastic Anisotropy(AU)
1.163
-
Elastic Stiffness Tensor(Cij)
Matrix (redacted)
Pa
Exfoliation Energy(Eexf)
499.8
meV/atom
Poisson's Ratio(ν)2 entries
0.2258
-
0.2500
-
Shear Modulus(G)3 entries
140.5
GPa
105.5
GPa
114.2
GPa
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Thermal Conductivity(k)
181
W/(m·K)
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
5.941
kg/m³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
3.250
eV
1.786
eV
Dielectric Constant (Relative Permittivity)(εr)3 entries
10.96
-
10.80
-
34.25
range 8.479–60.03median of 2 measurements
-
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-
Total Dielectric Tensor(ε)
Matrix (redacted)
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)2 entries
0.07426
C/m²
1.030
C/m²
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²
Seebeck Coefficient(S)
-59.54
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.00330
eV/atom
Formation Energy(ΔHf)2 entries
-0.5680
eV/atom
-0.5677
eV/atom
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.