Gallium oxide (Ga₂O₃) is a wide-bandgap semiconductor ceramic with a monoclinic crystal structure, positioned between silicon and gallium nitride in terms of performance capabilities. It is primarily developed for next-generation power electronics and high-frequency RF applications where superior breakdown voltage and thermal stability are critical, though it remains largely in research and early commercialization phases compared to mature semiconductors. Engineers consider Ga₂O₃ for applications demanding extreme operating conditions—high voltage switching, high-temperature circuits, and radiation-tolerant systems—where its wider bandgap offers fundamental advantages over conventional semiconductors, though manufacturing maturity and thermal management strategies remain active development areas.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Young's Modulus(E) | 37,854.9 | ksi | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Melting Point / Solidus(Tm) | 3,284.1 | °F | — | ||
Thermal Conductivity(k) | 7.511 | BTU/(hr·ft·°F) | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2150 | lb/in³ | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)4 entries | 4.400 | eV | Measured | ||
| ↳ | 4.800 | eV | — | ||
| ↳ | 2.267 | eV | DFT · OptB88vdW | ||
| ↳ | 4.048 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr) | 10.00 | - | — | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 4.137 | - | DFT · OptB88vdW | ||
| ↳ | 2.809 | - | DFT · TBmBJ | ||
Thermoelectric Power Factor(PF)2 entries | 0.000475 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00111 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -73.46 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 439.9 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 0.000 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Formation Energy(ΔHf) | -2.261 | eV/atom | Measured |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data