GaAs
semiconductorGallium Arsenide (GaAs) is a III-V direct bandgap semiconductor compound formed from gallium and arsenic, widely recognized as a foundational material in optoelectronics and high-frequency electronics. It is the primary material choice for photovoltaic cells in space applications, laser diodes, and integrated circuits operating at microwave and millimeter-wave frequencies where its superior electron mobility and direct bandgap outperform silicon. Engineers select GaAs over conventional semiconductors when high radiation tolerance, efficient light emission/detection, or extreme frequency performance is required—making it indispensable in satellite power systems, fiber-optic communications, and defense/aerospace RF applications, though its higher cost and brittleness limit use to applications where these advantages justify the trade-off.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 8,809.2 | ksi | — | ||
| ↳ | 8,809.2 | ksi | — | ||
| ↳ | 8,982.2 | ksi | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.4078 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | ksi | — | ||
Poisson's Ratio(ν)2 entries | 0.2253 | - | — | ||
| ↳ | 0.2300 | - | — | ||
Shear Modulus(G)3 entries | 5,924.6 | ksi | — | ||
| ↳ | 5,924.6 | ksi | — | ||
| ↳ | 6,138 | ksi | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Thermal Conductivity(k) | 18.55 | BTU/(hr·ft·°F) | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1843 | lb/in³ | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 1.460 | eV | — | ||
| ↳ | 0.08500 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 252.1 | - | — | ||
| ↳ | 36.22 range 35.12–37.31median of 2 measurements | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.1716 | C/m² | — | ||
| ↳ | 6.009 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -82.77 | µV/K | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -0.3840 | eV/atom | — | ||
| ↳ | -0.3346 | eV/atom | — |