CuCl

semiconductor
· CuCl

Copper(I) chloride (CuCl) is a semiconductor compound featuring a cuprous cation paired with chloride, positioned in the broader family of III-V and I-VII semiconductors used in optoelectronic applications. Historically employed in photomultiplier tubes, X-ray detection, and as a catalyst in organic synthesis, CuCl remains relevant in research contexts for UV-visible light emission and detection due to its direct bandgap character. Although less common than silicon or gallium arsenide in mainstream semiconductor manufacturing, CuCl offers potential advantages in niche applications where copper's optical properties and chloride's stability can be leveraged, particularly in photonics research and emerging thin-film device architectures.

photodetectors and UV sensorsphotomultiplier tube componentsX-ray scintillationcatalytic applicationsoptoelectronic researchthin-film photonics

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
Units:
siimperial
PropertyValueUnitConditionsSource
Bulk Modulus(K)2 entries
7,007.6
ksi—
↳
7,726.2
ksi—
Poisson's Ratio(ν)
0.4300
-—
Shear Modulus(G)2 entries
1,515.6
ksi—
↳
1,198
ksi—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Thermal Conductivity(k)
0.7280
BTU/(hr·ft·°F)—
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
0.1510
lb/in³—
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
3.240
eV—
↳
0.7290
eV—
Dielectric Constant (Relative Permittivity)(εr)2 entries
9.009
-—
↳
7.714
range 6.429–8.999median of 2 measurements
-—
Magnetic Moment(μB)
0.000
µB—
Piezoelectric Modulus(eij)2 entries
0.3100
C/m²—
↳
0.3987
C/m²—
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²—
Seebeck Coefficient(S)
-83.08
µV/K—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.01220
eV/atom—
Formation Energy(ΔHf)2 entries
-0.7155
eV/atom—
↳
-0.4334
eV/atom—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.
CuCl — Properties & Data | MatWorld