CuCl — Properties & Data | MatWorld

CuCl

semiconductor

· CuCl

Copper(I) chloride (CuCl) is a semiconductor compound featuring a cuprous cation paired with chloride, positioned in the broader family of III-V and I-VII semiconductors used in optoelectronic applications. Historically employed in photomultiplier tubes, X-ray detection, and as a catalyst in organic synthesis, CuCl remains relevant in research contexts for UV-visible light emission and detection due to its direct bandgap character. Although less common than silicon or gallium arsenide in mainstream semiconductor manufacturing, CuCl offers potential advantages in niche applications where copper's optical properties and chloride's stability can be leveraged, particularly in photonics research and emerging thin-film device architectures.

photodetectors and UV sensorsphotomultiplier tube componentsX-ray scintillationcatalytic applicationsoptoelectronic researchthin-film photonics

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

Property	Value	Unit	Conditions	Source
Bulk Modulus(K)2 entries	48.32	GPa	—
↳	53.27	GPa	—
Poisson's Ratio(ν)	0.4300	-	—
Shear Modulus(G)2 entries	10.45	GPa	—
↳	8.260	GPa	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Thermal Conductivity(k)	1.260	W/(m·K)	—

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	4.180	kg/m³	—

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Band Gap(Eg)2 entries	3.240	eV	—
↳	0.7290	eV	—
Dielectric Constant (Relative Permittivity)(εr)2 entries	9.009	-	—
↳	7.714 range 6.429–8.999median of 2 measurements	-	—
Magnetic Moment(μB)	0.000	µB	—
Piezoelectric Modulus(eij)2 entries	0.3100	C/m²	—
↳	0.3987	C/m²	—
Piezoelectric Stress Tensor(eij)	Matrix (redacted)	C/m²	—
Seebeck Coefficient(S)	-83.08	µV/K	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.01220	eV/atom	—
Formation Energy(ΔHf)2 entries	-0.7155	eV/atom	—
↳	-0.4334	eV/atom	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.