CuBr — Properties & Data | MatWorld

CuBr

semiconductor

· CuBr

Copper(I) bromide (CuBr) is a binary semiconductor compound with zinc blende crystal structure, combining copper and bromine in a 1:1 stoichiometric ratio. Historically used in photography and as a catalyst in organic synthesis, CuBr has attracted renewed interest in optoelectronics and thin-film device research due to its direct bandgap and potential for cost-effective semiconductor applications. Its relatively low thermal conductivity and layered exfoliation energy suggest potential for 2D material derivatives and heterostructure engineering, though it remains primarily a research material rather than a high-volume industrial semiconductor.

optoelectronic researchthin-film semiconductorsphotocatalysisorganic synthesis catalysts2D material derivativeslaboratory photography applications

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

Property	Value	Unit	Conditions	Source
Bulk Modulus(K)2 entries	42.86	GPa	—
↳	24.37	GPa	—
Exfoliation Energy(Eexf)	75.37	meV/atom	—
Poisson's Ratio(ν)	0.3300	-	—
Shear Modulus(G)2 entries	12.75	GPa	—
↳	10.32	GPa	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Thermal Conductivity(k)	2.750	W/(m·K)	—

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Property	Value	Unit	Conditions	Source
Density(ρ)	5.396	kg/m³	—

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Property	Value	Unit	Conditions	Source
Band Gap(Eg)2 entries	3.080	eV	—
↳	1.012	eV	—
Dielectric Constant (Relative Permittivity)(εr)3 entries	11.57	-	—
↳	18.83	-	—
↳	11.48 range 10.20–12.76median of 2 measurements	-	—
Electronic Dielectric Tensor(ε∞)	Matrix (redacted)	-	—
Total Dielectric Tensor(ε)	Matrix (redacted)	-	—
Magnetic Moment(μB)	0.000	µB	—
Piezoelectric Modulus(eij)2 entries	0.1795	C/m²	—
↳	0.000	C/m²	—
Piezoelectric Stress Tensor(eij)	Matrix (redacted)	C/m²	—
Seebeck Coefficient(S)	-80.66	µV/K	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.01770	eV/atom	—
Formation Energy(ΔHf)2 entries	-0.5421	eV/atom	—
↳	-0.2551	eV/atom	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.