Cu4SnP10 — Properties & Data | MatWorld

Cu4SnP10

metal

· Cu4SnP10

Cu4SnP10 is a quaternary copper-tin-phosphorus intermetallic compound that combines copper's excellent electrical and thermal conductivity with tin and phosphorus alloying elements to modify strength and phase stability. This material belongs to the family of copper-based intermetallics and is primarily of research and developmental interest rather than established in high-volume production; its potential applications center on electrical contacts, thermal management components, and specialty alloy development where the specific combination of copper's conductive properties with enhanced mechanical performance from tin and phosphorus is advantageous.

electrical contacts and connectorsthermal management devicesintermetallic research materialscopper alloy developmenthigh-temperature electrical applications

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions	Source
Density(ρ)	0.1460	lb/in³	DFT · OptB88vdW

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Method

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)	0.4370	eV	DFT · OptB88vdW
Dielectric Constant (Relative Permittivity)(εr)	18.69 range 17.57–19.81median of 2 measurements	-	DFT · PBEsol
High-Frequency Dielectric Constant (ε∞)(ε∞)	16.29	-	DFT · OptB88vdW
Electron Effective Mass(m*e)	0.09667	me	DFT · OptB88vdW · 27°C
Hole Effective Mass(m*h)	0.1367	me	DFT · OptB88vdW · 27°C
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.00191	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00243	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-135.5	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	287.1	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.000	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	-0.1424	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

Cu4SnP10

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

Environmental

Export Control