Cu2HgI4

metal
· Cu2HgI4

Cu₂HgI₄ is a ternary intermetallic compound combining copper, mercury, and iodine—a material class rarely encountered in conventional engineering but studied primarily in solid-state physics and materials research contexts. It exhibits semiconductor or mixed-valence properties typical of copper-mercury halides, making it relevant to specialized photonic, optoelectronic, or thermoelectric research rather than mainstream structural or mechanical applications. This compound is of interest in niche academic and exploratory industrial settings where unusual electronic or optical behavior is being investigated, though practical deployment remains limited due to mercury's toxicity constraints and the material's likely brittleness.

experimental optoelectronicssolid-state physics researchphotonic devices (research phase)thermoelectric studieshalide compound researchlaboratory instrumentation (specialized)

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)2 entries
2,645.5
ksi
3,306.9
ksi
Poisson's Ratio(ν)
0.3200
-
Shear Modulus(G)2 entries
1,313.8
ksi
1,427.2
ksi
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
0.2166
lb/in³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)
0.5140
eV
Dielectric Constant (Relative Permittivity)(εr)3 entries
12.02
-
12.02
-
9.822
range 8.532–11.11median of 2 measurements
-
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-
Total Dielectric Tensor(ε)
Matrix (redacted)
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)2 entries
0.08579
C/m²
0.3966
C/m²
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²
Seebeck Coefficient(S)
-109.5
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.000
eV/atom
Formation Energy(ΔHf)
-0.1685
eV/atom
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.