CdS

semiconductor
· CdS

Cadmium sulfide (CdS) is a direct bandgap II-VI semiconductor compound with a hexagonal crystal structure, traditionally valued for its photovoltaic and photoluminescent properties. It is widely used in thin-film solar cells (particularly in heterojunction architectures with copper indium diselenide), photodetectors, and optoelectronic devices, where its tunable bandgap and strong light absorption in the visible spectrum make it advantageous for converting solar radiation to electrical current. CdS also finds application in phosphors for displays and lighting, though environmental and health concerns regarding cadmium toxicity have driven research into alternative lead-free semiconductors for emerging applications.

photovoltaic solar cellsthin-film electronicsphotodetectors and sensorsluminescent displaysoptoelectronic devicesradiation detection

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)3 entries
7,732.3
ksi
7,732.3
ksi
2,455.5
ksi
Elastic Compliance Tensor(Sij)
Matrix (redacted)
1/GPa
Elastic Anisotropy(AU)
0.1672
-
Elastic Stiffness Tensor(Cij)
Matrix (redacted)
ksi
Exfoliation Energy(Eexf)
948.9
meV/atom
Poisson's Ratio(ν)2 entries
0.3514
-
0.3700
-
Shear Modulus(G)3 entries
2,551.7
ksi
2,551.7
ksi
1,551.9
ksi
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Thermal Conductivity(k)
11.50
BTU/(hr·ft·°F)
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
0.1460
lb/in³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
2.500
eV
0.8860
eV
Dielectric Constant (Relative Permittivity)(εr)3 entries
10.49
-
10.43
-
8.609
range 6.852–10.37median of 2 measurements
-
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-
Total Dielectric Tensor(ε)
Matrix (redacted)
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)2 entries
0.1147
C/m²
0.5279
C/m²
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²
Seebeck Coefficient(S)
-71.91
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.3119
eV/atom
Formation Energy(ΔHf)2 entries
-0.7742
eV/atom
-0.3585
eV/atom
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.