BeSe
ceramic· BeSe
Beryllium selenide (BeSe) is a wide-bandgap semiconductor ceramic compound formed from beryllium and selenium, belonging to the II-VI semiconductor family. It is primarily of research and development interest for optoelectronic and high-temperature applications, where its wide bandgap and thermal properties are leveraged; industrial adoption remains limited compared to more mature semiconductors like GaAs or InP, but the material shows promise in UV detectors, high-energy radiation sensing, and specialized photonic devices where its bandgap characteristics offer advantages over conventional alternatives.
UV photodetectorsRadiation-hard semiconductorsHigh-temperature electronicsResearch optoelectronicsX-ray/gamma-ray sensingWide-bandgap device research
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 11,371 | ksi | — | ||
Poisson's Ratio(ν) | 0.2200 | - | — | ||
Shear Modulus(G) | 8,284.6 | ksi | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Thermal Conductivity(k) | 62.40 | BTU/(hr·ft·°F) | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1530 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 4.000 | eV | — | ||
| ↳ | 2.848 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 7.720 | - | — | ||
| ↳ | 7.750 | - | — | ||
| ↳ | 6.925 range 6.117–7.734median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.1201 | C/m² | — | ||
| ↳ | 0.5933 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -164.3 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.03930 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.8910 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.