BaS — Properties & Data | MatWorld

BaS

semiconductor

· BaS

Barium sulfide (BaS) is an inorganic ceramic semiconductor compound belonging to the II-VI semiconductor family, characterized by a rock-salt crystal structure. It is primarily investigated in research and specialized industrial contexts for optoelectronic and photonic applications, particularly in infrared detection systems, scintillation detectors, and phosphor materials where its wide bandgap and optical properties are leveraged. While less commercially prevalent than gallium arsenide or other III-V semiconductors, BaS is notable for its thermal stability and potential in high-temperature or radiation-resistant device environments where traditional semiconductors degrade.

infrared detectors and sensorsscintillation and radiation detectionphosphor and luminescent coatingshigh-temperature semiconductor researchoptical window materialsspecialty optoelectronics

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

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Method

Property	Value	Unit	Conditions	Source
Bulk Modulus(K)3 entries	6,003.1	ksi	DFT
↳	6,584.7	ksi	DFT · OptB88vdW
↳	6,003.1	ksi	DFT · PBE
Elastic Compliance Tensor(Sij)	Matrix (redacted)	1/GPa	DFT · PBE
Elastic Anisotropy(AU)	0.5561	-	DFT · PBE
Elastic Stiffness Tensor(Cij)	Matrix (redacted)	ksi	DFT · PBE
Poisson's Ratio(ν)2 entries	0.2600	-	DFT · OptB88vdW
↳	0.2497	-	DFT · PBE
Shear Modulus(G)3 entries	3,606.9	ksi	DFT
↳	4,159.7	ksi	DFT · OptB88vdW
↳	3,606.9	ksi	DFT · PBE

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Thermal Conductivity(k)	1,698.7	BTU/(hr·ft·°F)	Measured

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.1535	lb/in³	DFT · OptB88vdW

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Method

Carrier

Property	Value	Unit	Conditions	Source
Band Gap(Eg)4 entries	1.450	eV	Measured
↳	1.460	eV	Measured
↳	2.148	eV	DFT · OptB88vdW
↳	3.279	eV	DFT · TBmBJ
Dielectric Constant (Relative Permittivity)(εr)3 entries	13.51	-	DFT · OptB88vdW
↳	14.95	-	DFT · PBE
↳	10.08 range 10.03–10.13median of 2 measurements	-	DFT · PBEsol
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries	5.252	-	DFT · OptB88vdW
↳	4.289	-	DFT · TBmBJ
Electronic Dielectric Tensor(ε∞)	Matrix (redacted)	-	DFT · PBE
Total Dielectric Tensor(ε)	Matrix (redacted)	-	DFT · PBE
Electron Effective Mass(m*e)	0.4300	me	DFT · OptB88vdW · 27°C
Hole Effective Mass(m*h)	0.8600	me	DFT · OptB88vdW · 27°C
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)2 entries	0.000	C/m²	DFT · OptB88vdW
↳	0.02777	C/m²	DFT · PBE
Piezoelectric Stress Tensor(eij)	Matrix (redacted)	C/m²	DFT · PBE
Thermoelectric Power Factor(PF)2 entries	0.00237	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00404	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-189.7	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	373.4	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	2.410	%	DFT · TBmBJ

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Method

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.000	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)2 entries	-2.275	eV/atom	DFT · OptB88vdW
↳	-2.402	eV/atom	Measured

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.