AlSb

semiconductor
· AlSb

Aluminum antimonide (AlSb) is a III-V compound semiconductor with a zinc-blende crystal structure, formed from aluminum and antimony. It is primarily used in optoelectronic and high-frequency electronic devices where its direct bandgap and carrier mobility characteristics are advantageous. AlSb serves as a substrate material and active layer in infrared detectors, high-electron-mobility transistors (HEMTs), and millimeter-wave components, with particular value in space and defense applications where radiation hardness and thermal stability matter; it is less common than GaAs or InP in mainstream electronics but remains important for specialized infrared imaging and ultra-high-speed RF circuits.

infrared detectors and focal plane arrayshigh-electron-mobility transistors (HEMTs)millimeter-wave and terahertz devicesspace and radiation-hardened electronicsheterojunction substratesquantum well structures

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)3 entries
49.20
GPa
49.20
GPa
50.43
GPa
Elastic Compliance Tensor(Sij)
Matrix (redacted)
1/GPa
Elastic Anisotropy(AU)
0.3437
-
Elastic Stiffness Tensor(Cij)
Matrix (redacted)
Pa
Poisson's Ratio(ν)2 entries
0.2496
-
0.2600
-
Shear Modulus(G)3 entries
29.58
GPa
29.58
GPa
30.02
GPa
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Thermal Conductivity(k)
77.40
W/(m·K)
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
4.094
kg/m³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
1.670
eV
1.322
eV
Dielectric Constant (Relative Permittivity)(εr)2 entries
13.64
-
12.45
range 11.80–13.10median of 2 measurements
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)2 entries
0.05672
C/m²
0.5411
C/m²
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²
Seebeck Coefficient(S)
-248.1
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.000
eV/atom
Formation Energy(ΔHf)2 entries
-0.2601
eV/atom
-0.2431
eV/atom
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.