AlP — Properties & Data | MatWorld

AlP

semiconductor

· AlP

Aluminum phosphide (AlP) is a III-V compound semiconductor with a direct bandgap, belonging to the same material family as gallium arsenide and indium phosphide. It is primarily used in optoelectronic and high-frequency electronic devices where its wide bandgap and thermal stability offer advantages over some alternative semiconductors. AlP serves niche applications in ultraviolet light-emitting devices, high-temperature electronics, and as a substrate or buffer layer in heterojunction devices, though it remains less common than GaAs or GaN due to processing challenges and material maturity.

UV light-emitting devicesHigh-temperature electronicsOptoelectronic heterostructuresSemiconductor substratesResearch-phase photonic applications

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

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Method

Property	Value	Unit	Conditions	Source
Bulk Modulus(K)3 entries	12,353.1	ksi	DFT
↳	12,091.8	ksi	DFT · OptB88vdW
↳	12,353.1	ksi	DFT · PBE
Elastic Compliance Tensor(Sij)	Matrix (redacted)	1/GPa	DFT · PBE
Elastic Anisotropy(AU)	0.5259	-	DFT · PBE
Elastic Stiffness Tensor(Cij)	Matrix (redacted)	ksi	DFT · PBE
Exfoliation Energy(Eexf)	65.32	meV/atom	DFT · OptB88vdW
Poisson's Ratio(ν)2 entries	0.2600	-	DFT · OptB88vdW
↳	0.2661	-	DFT · PBE
Shear Modulus(G)3 entries	6,845.9	ksi	DFT
↳	7,254.8	ksi	DFT · OptB88vdW
↳	6,845.9	ksi	DFT · PBE

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Thermal Conductivity(k)	48.53	BTU/(hr·ft·°F)	Measured

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.08295	lb/in³	DFT · OptB88vdW

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Carrier

Property	Value	Unit	Conditions	Source
Band Gap(Eg)3 entries	3.620	eV	Measured
↳	1.794	eV	DFT · OptB88vdW
↳	2.563	eV	DFT · TBmBJ
Dielectric Constant (Relative Permittivity)(εr)3 entries	10.33	-	DFT · OptB88vdW
↳	10.52	-	DFT · PBE
↳	9.501 range 8.422–10.58median of 2 measurements	-	DFT · PBEsol
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries	8.613	-	DFT · OptB88vdW
↳	6.890	-	DFT · TBmBJ
Electronic Dielectric Tensor(ε∞)	Matrix (redacted)	-	DFT · PBE
Total Dielectric Tensor(ε)	Matrix (redacted)	-	DFT · PBE
Electron Effective Mass(m*e)	0.3400	me	DFT · OptB88vdW · 27°C
Hole Effective Mass(m*h)	0.8400	me	DFT · OptB88vdW · 27°C
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)2 entries	0.6648	C/m²	DFT · OptB88vdW
↳	0.000358	C/m²	DFT · PBE
Piezoelectric Stress Tensor(eij)	Matrix (redacted)	C/m²	DFT · PBE
Thermoelectric Power Factor(PF)2 entries	0.00214	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00383	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-166.3	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	314.8	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	11.42	%	DFT · TBmBJ

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Method

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.000	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)2 entries	-0.7517	eV/atom	DFT · OptB88vdW
↳	-0.8519	eV/atom	Measured

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.