AlNaON2 is an experimental nitride-based semiconductor compound containing aluminum, sodium, oxygen, and nitrogen. This material belongs to the family of mixed-anion semiconductors and is primarily investigated in research contexts for wide-bandgap optoelectronic and electronic device applications. The inclusion of sodium as a dopant or structural component distinguishes it from conventional III-V nitrides (such as GaN), making it a candidate for exploring novel electronic properties, though industrial adoption remains limited pending further development and characterization.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 1.200 | eV | — | ||
Magnetic Moment(μB) | 1.323e-7 | μB | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Formation Energy(ΔHf) | 2.160 | eV/atom | — |