AlN

metal
· AlN

Aluminum nitride (AlN) is a wide-bandgap ceramic compound that combines metallic aluminum with nitrogen, forming a hexagonal crystal structure with exceptional thermal and electrical properties. It is widely used in high-power electronics, optoelectronics, and thermal management applications where efficient heat dissipation and electrical isolation are critical—particularly in RF power amplifiers, LED substrates, and integrated circuit packaging. Engineers select AlN over alternatives like alumina or silicon carbide when superior thermal conductivity paired with electrical insulation is needed in space-constrained or high-frequency applications.

RF power amplifiersLED thermal substratesIntegrated circuit packagingHigh-frequency electronicsThermal management ceramicsMicroelectronic device isolation

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)3 entries
28,196.1
ksi
28,196.1
ksi
31,019.2
ksi
Elastic Compliance Tensor(Sij)
Matrix (redacted)
1/GPa
Elastic Anisotropy(AU)
0.03437
-
Elastic Stiffness Tensor(Cij)
Matrix (redacted)
ksi
Exfoliation Energy(Eexf)
499.2
meV/atom
Poisson's Ratio(ν)2 entries
0.2413
-
0.2500
-
Shear Modulus(G)3 entries
17,626.6
ksi
17,626.6
ksi
19,690.3
ksi
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Thermal Conductivity(k)
135.8
BTU/(hr·ft·°F)
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
0.1236
lb/in³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
5.900
eV
3.688
eV
Dielectric Constant (Relative Permittivity)(εr)2 entries
78.96
-
11.26
range 5.103–17.43median of 2 measurements
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)2 entries
0.2859
C/m²
0.000
C/m²
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²
Seebeck Coefficient(S)
-100.3
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.1269
eV/atom
Formation Energy(ΔHf)2 entries
-1.648
eV/atom
-1.523
eV/atom
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.