AlCuS₂ is a ternary semiconductor compound combining aluminum, copper, and sulfur elements, belonging to the family of mixed-metal chalcogenides. This material is primarily of research interest rather than established in commercial production, with potential applications in optoelectronic devices and photovoltaic systems where its semiconducting properties could enable light absorption or charge transport in layered device architectures. The copper-aluminum-sulfur system is being investigated as an alternative to more conventional semiconductors due to potential cost advantages and tunable electronic properties, though material processing and performance optimization remain active research areas.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 11,667.2 | ksi | DFT | ||
| ↳ | 12,023.6 | ksi | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.3200 | - | DFT · OptB88vdW | ||
Shear Modulus(G)2 entries | 5,095.4 | ksi | DFT | ||
| ↳ | 5,389.6 | ksi | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1240 | lb/in³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 3.500 | eV | Measured | ||
| ↳ | 1.896 | eV | DFT · OptB88vdW | ||
| ↳ | 2.545 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 8.720 | - | DFT · OptB88vdW | ||
| ↳ | 8.680 | - | DFT · PBE | ||
| ↳ | 7.901 range 6.979–8.823median of 2 measurements | - | DFT · PBEsol | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 6.710 | - | DFT · OptB88vdW | ||
| ↳ | 5.656 | - | DFT · TBmBJ | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | DFT · PBE | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | DFT · PBE | ||
Electron Effective Mass(m*e) | 0.2567 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 1.910 | me | DFT · OptB88vdW · 27°C | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij)2 entries | 0.5837 | C/m² | DFT · OptB88vdW | ||
| ↳ | 0.07648 | C/m² | DFT · PBE | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | DFT · PBE | ||
Thermoelectric Power Factor(PF)2 entries | 0.000766 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00132 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -95.62 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 338.8 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 11.79 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000300 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf) | -0.9432 | eV/atom | DFT · OptB88vdW |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data