AlCuS2
semiconductor· AlCuS2
AlCuS₂ is a ternary semiconductor compound combining aluminum, copper, and sulfur elements, belonging to the family of mixed-metal chalcogenides. This material is primarily of research interest rather than established in commercial production, with potential applications in optoelectronic devices and photovoltaic systems where its semiconducting properties could enable light absorption or charge transport in layered device architectures. The copper-aluminum-sulfur system is being investigated as an alternative to more conventional semiconductors due to potential cost advantages and tunable electronic properties, though material processing and performance optimization remain active research areas.
photovoltaic researchoptoelectronic devicesthin-film semiconductorssolar cell developmentmaterials researchsemiconductor alloys
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 80.44 | GPa | — | ||
| ↳ | 82.90 | GPa | — | ||
Poisson's Ratio(ν) | 0.3200 | - | — | ||
Shear Modulus(G)2 entries | 35.13 | GPa | — | ||
| ↳ | 37.16 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 3.433 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.500 | eV | — | ||
| ↳ | 1.897 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 8.680 | - | — | ||
| ↳ | 8.720 | - | — | ||
| ↳ | 7.901 range 6.979–8.823median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.07648 | C/m² | — | ||
| ↳ | 0.5837 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -95.30 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000300 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.9432 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.