AlAgTe2
semiconductor· AlAgTe2
AlAgTe2 is a ternary semiconductor compound combining aluminum, silver, and tellurium in a layered crystalline structure. This material belongs to the family of chalcogenide semiconductors and is primarily of research interest for optoelectronic and thermoelectric applications, where its combination of moderate mechanical stiffness and semiconducting properties could enable advanced device designs. While not yet widely commercialized, materials in this compositional family are being investigated for next-generation photovoltaics, infrared detectors, and solid-state thermoelectric generators where the interaction between electrical transport and thermal properties becomes critical.
thermoelectric energy conversioninfrared detectorsexperimental semiconductorsoptoelectronic devicesresearch photovoltaics
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 42.36 | GPa | — | ||
| ↳ | 45.49 | GPa | — | ||
Poisson's Ratio(ν) | 0.3400 | - | — | ||
Shear Modulus(G)2 entries | 16.70 | GPa | — | ||
| ↳ | 17.05 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 5.211 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 1.800 | eV | — | ||
| ↳ | 1.074 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 10.95 | - | — | ||
| ↳ | 11.18 | - | — | ||
| ↳ | 10.17 range 9.313–11.02median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.02485 | C/m² | — | ||
| ↳ | 0.5815 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -46.06 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.3620 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.