Silver sulfide (Ag₂S) is a narrow-bandgap semiconductor compound belonging to the chalcogenide family, formed from the combination of silver and sulfur elements. It is primarily investigated for optoelectronic and photonic applications where its narrow bandgap enables detection and emission in the infrared and visible wavelength ranges. Ag₂S is notably used in infrared detectors, photocells, and historical photographic emulsions, though it has largely been superseded by synthetic alternatives in commercial photography; however, it remains of significant research interest for emerging applications in quantum dots, thin-film solar cells, and infrared sensing devices due to its tunable optical properties and potential for low-cost manufacturing.
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| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 44.91 | GPa | DFT · OptB88vdW | ||
Exfoliation Energy(Eexf) | 155.4 | meV/atom | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.3900 | - | DFT · OptB88vdW | ||
Shear Modulus(G) | 10.11 | GPa | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 6.659 | kg/m³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 1.230 | eV | Measured | ||
| ↳ | 1.074 | eV | DFT · OptB88vdW | ||
| ↳ | 1.928 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 17.65 | - | DFT · OptB88vdW | ||
| ↳ | 11.71 | - | DFT · PBE | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 9.921 | - | DFT · OptB88vdW | ||
| ↳ | 6.795 | - | DFT · TBmBJ | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | DFT · PBE | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | DFT · PBE | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij)2 entries | 0.1909 | C/m² | DFT · OptB88vdW | ||
| ↳ | 0.06179 | C/m² | DFT · PBE | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | DFT · PBE | ||
Thermoelectric Power Factor(PF)2 entries | 0.00128 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00405 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -125 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 306.6 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 24.58 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.00200 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf)2 entries | -0.07359 | eV/atom | DFT · OptB88vdW | ||
| ↳ | -0.1099 | eV/atom | Measured |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data