ZnSe
semiconductor· ZnSe
ZnSe is a II-VI compound semiconductor with a zinc-blende crystal structure, combining zinc and selenium for direct bandgap optoelectronic performance. It is primarily used in infrared optics, laser systems, and high-energy radiation detection where its transparency in the mid-infrared spectrum and radiation hardness are critical. ZnSe is valued in applications requiring windows, lenses, and detectors that operate in wavelength ranges where conventional optical materials (glass, sapphire) are opaque, making it essential for thermal imaging, CO₂ laser optics, and space-based instrumentation despite higher cost than alternatives.
infrared optics and windowsCO₂ laser componentsthermal imaging systemsradiation detectorsspace instrumentationhigh-energy physics experiments
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 58.26 | GPa | — | ||
| ↳ | 58.26 | GPa | — | ||
| ↳ | 59.70 | GPa | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.7271 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | Pa | — | ||
Exfoliation Energy(Eexf) | 89.18 | meV/atom | — | ||
Poisson's Ratio(ν)2 entries | 0.2959 | - | — | ||
| ↳ | 0.3000 | - | — | ||
Shear Modulus(G)3 entries | 27.53 | GPa | — | ||
| ↳ | 27.53 | GPa | — | ||
| ↳ | 28.86 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Thermal Conductivity(k) | 15.60 | W/(m·K) | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 5.132 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 2.790 | eV | — | ||
| ↳ | 1.224 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 10.40 | - | — | ||
| ↳ | 11.65 | - | — | ||
| ↳ | 9.353 range 7.903–10.80median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.03296 | C/m² | — | ||
| ↳ | 0.7398 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -41.04 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -0.8457 | eV/atom | — | ||
| ↳ | -0.7180 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.