XeF3 — Properties & Data | MatWorld

XeF3

ceramic

· JVASP-32666· XeF3

XeF₃ is an experimental interhalogen ceramic compound formed from xenon and fluorine, representing a rare and highly reactive material class not yet established in commercial engineering practice. This compound exists primarily in research contexts exploring exotic fluoride chemistry and extreme-environment materials; it is not routinely specified for industrial applications due to its extreme reactivity, limited synthesis scalability, and the challenging conditions required for handling and stability. Engineers would encounter this material only in specialized research settings (such as advanced fluorine chemistry, nuclear fuel cycles, or fundamental materials science studies) rather than in conventional structural or functional engineering applications.

experimental research compoundsadvanced fluorine chemistrynuclear/isotope processing researchextreme reactivity materials studyinterhalogen compound synthesis

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions	Source
Density(ρ)	4.202	kg/m³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Filter by

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)	2.361	eV	DFT · OptB88vdW
Dielectric Constant (Relative Permittivity)(εr)	4.505	-	DFT · OptB88vdW
High-Frequency Dielectric Constant (ε∞)(ε∞)	3.988	-	DFT · OptB88vdW
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)	0.000	C/m²	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.000400	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.000323	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-446	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	467.8	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.00170	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	-0.5595	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

XeF3

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

Environmental