TaI4 — Properties & Data | MatWorld

TaI4

ceramic

· JVASP-31884· TaI4

TaI₄ is a tantalum iodide ceramic compound that exists primarily in research and experimental contexts rather than established industrial production. This material belongs to the family of metal halide ceramics and has attracted attention in materials science for potential applications in optoelectronics, solid-state chemistry, and specialized semiconductor research where iodide compounds show promise for photonic and electronic properties. While not yet widely deployed in commercial engineering applications, tantalum halides are of interest to researchers exploring alternatives in high-performance ceramic systems and functional materials where tantalum's chemical stability and iodine's optical properties may offer advantages.

research and developmentexperimental semiconductorsoptoelectronic materialsceramic compound researchspecialized chemical synthesistantalum-based ceramics

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions	Source
Density(ρ)	5.904	kg/m³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

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Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)	0.4450	eV	DFT · OptB88vdW
High-Frequency Dielectric Constant (ε∞)(ε∞)	9.742	-	DFT · OptB88vdW
Electron Effective Mass(m*e)	0.3167	me	DFT · OptB88vdW · 27°C
Hole Effective Mass(m*h)	0.3333	me	DFT · OptB88vdW · 27°C
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.000501	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.000350	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-236.2	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	272.5	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.000	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	-0.4464	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

TaI4

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

Environmental