SiGeO2S — Properties & Data | MatWorld

SiGeO2S

ceramic

· SiGeO2S

SiGeO₂S is a quaternary ceramic compound combining silicon, germanium, oxygen, and sulfur—a research-phase material exploring mixed anion systems that bridge conventional silicates and sulfides. This composition family is investigated primarily for optoelectronic and photonic applications where the S incorporation modifies bandgap and refractive properties relative to pure oxide or sulfide ceramics, with potential relevance in infrared optics, semiconducting ceramics, or solid-state device windows.

infrared optics and windowsphotonic devices (research)wide-bandgap semiconductorsmixed anion ceramics (experimental)thin-film optical coatingsthermal imaging components

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

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Method

Property	Value	Unit	Conditions	Source
Band Gap(Eg)	0.000	eV	DFT · GLLB-SC
Magnetic Moment(μB)	-4.090e-7	μB	DFT

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Formation Energy(ΔHf)	1.400	eV/atom	DFT

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

SiGeO2S

Electrical Properties

Other Properties

Regulatory Screening

Environmental