Indium Phosphide (InP) — Properties & Data | MatWorld

Indium Phosphide (InP)

Verifiedsemiconductor

· InP· Indium Phosphide

Indium phosphide (InP) is a III-V binary compound semiconductor with a direct bandgap, widely recognized for high-speed and high-frequency device performance. It is the material of choice for optoelectronic and RF applications where superior electron mobility and saturation velocity enable operation at frequencies and data rates that exceed silicon and gallium arsenide alternatives. InP's direct bandgap makes it especially valuable for integrated photonics, long-wavelength infrared detectors, and millimeter-wave integrated circuits used in telecommunications, aerospace, and emerging 5G/6G systems.

High-speed optoelectronic integrated circuitsLong-wavelength optical communication (1.3–1.65 μm)Millimeter-wave and terahertz devicesInfrared photodetectors and focal plane arraysSpace and satellite communicationsQuantum-dot and heterostructure research

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

Property OverviewNormalized to typical max values

Property	Value	Unit	Conditions	Source
Young's Modulus(E)	61.00	GPa	—

Verified Unverified Low confidence (<80%) Link to source

Filter by

Method

Property	Value	Unit	Conditions	Source
Melting Point / Solidus(Tm)	1,335	K	—
Specific Heat Capacity(Cp)	310	J/(kg·K)	—
Thermal Conductivity(k)2 entries	85.20	W/(m·K)	Measured
↳	68.00	W/(m·K)	—
Coefficient of Thermal Expansion(α (CTE))	0.00000460	1/K	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	4.810	kg/m³	—

Verified Unverified Low confidence (<80%) Link to source

Filter by

Method

Carrier

Property	Value	Unit	Conditions	Source
Band Gap(Eg)4 entries	1.500	eV	Measured
↳	1.340	eV	—
↳	0.3310	eV	DFT · OptB88vdW
↳	1.387	eV	DFT · TBmBJ
Dielectric Constant (Relative Permittivity)(εr)	12.50	-	—
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries	23.59	-	DFT · OptB88vdW
↳	8.039	-	DFT · TBmBJ
Electron Effective Mass(m*e)	0.05000	me	DFT · OptB88vdW · 27°C
Hole Effective Mass(m*h)	0.1400	me	DFT · OptB88vdW · 27°C
Thermoelectric Power Factor(PF)2 entries	0.000146	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00320	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-29.47	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	259.2	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	33.85	%	DFT · TBmBJ

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

3 interactive curves for this material

Stress-strain, S-N fatigue and environmental knockdown curves are free with an account.

Create free account

Property	Value	Unit	Conditions	Source
Extinction Coefficient vs Wavelength(k(λ))	Curve (46 pts)	-	Measured
Refractive Index vs Wavelength(n(λ))2 entries	Curve (46 pts)	-	Measured
↳	Curve (101 pts)	-	Measured

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Formation Energy(ΔHf)	-0.3902	eV/atom	Measured

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.