GeHfO2S is an experimental quaternary semiconductor compound combining germanium, hafnium, oxygen, and sulfur elements. This material belongs to the emerging class of mixed-anion and mixed-cation semiconductors being investigated for next-generation optoelectronic and photovoltaic devices. Research into GeHfO2S and related compounds is driven by the potential to engineer bandgaps and electronic properties beyond what single-compound semiconductors offer, making it relevant for photocatalysis, light emission, and advanced solar cell architectures where conventional materials like Si or GaAs reach performance limits.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 2.300 | eV | — | ||
Magnetic Moment(μB) | -0.000655 | μB | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Formation Energy(ΔHf) | 0.6600 | eV/atom | — |