Gallium sulfide (GaS) is a III-VI semiconductor compound belonging to the family of layered transition metal dichalcogenides and related materials. It exists as a two-dimensional layered crystal structure, making it of significant interest in emerging optoelectronic and nanoelectronic device research. GaS is primarily investigated in academic and advanced materials research contexts rather than established industrial production, with potential applications in next-generation electronics where its direct bandgap and layer-dependent properties could enable novel photodetectors, field-effect transistors, and integrated photonic devices.
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| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 40.47 | GPa | DFT · OptB88vdW | ||
Exfoliation Energy(Eexf) | 56.22 | meV/atom | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.2400 | - | DFT · OptB88vdW | ||
Shear Modulus(G) | 25.58 | GPa | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 3.845 | kg/m³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)4 entries | 2.590 | eV | Measured | ||
| ↳ | 1.500 | eV | DFT · OptB88vdW | ||
| ↳ | 2.450 | eV | DFT · TBmBJ | ||
| ↳ | 2.350 | eV | DFT · HSE06 | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 10.53 | - | DFT · OptB88vdW | ||
| ↳ | 7.650 | - | DFT · PBE | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 7.519 | - | DFT · OptB88vdW | ||
| ↳ | 5.713 | - | DFT · TBmBJ | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | DFT · PBE | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | DFT · PBE | ||
Electron Effective Mass(m*e) | 0.1867 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 1.607 | me | DFT · OptB88vdW · 27°C | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | DFT · OptB88vdW | ||
Thermoelectric Power Factor(PF)2 entries | 0.00362 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00192 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -223.2 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 180.5 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 13.64 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf)2 entries | -0.7069 | eV/atom | DFT · OptB88vdW | ||
| ↳ | -1.084 | eV/atom | Measured |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data