CuP2

semiconductor
· CuP2

CuP2 is a copper phosphide semiconductor compound that belongs to the metal phosphide family, which are being investigated for optoelectronic and photovoltaic applications due to their tunable band gaps and relatively abundant constituent elements. This material is primarily of research and developmental interest rather than established in high-volume manufacturing, with potential applications in solar cells, photodetectors, and catalytic systems where conventional semiconductors face cost or performance limitations. CuP2 is notable within the phosphide semiconductor class for combining copper's good conductivity with phosphorus's semiconductor properties, offering a lower-toxicity and lower-cost alternative pathway compared to conventional III-V semiconductors or lead-based perovskites.

experimental photovoltaicsphotodetectorselectrocatalysisresearch semiconductorsearth-abundant electronicsthin-film devices

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
Units:
siimperial
PropertyValueUnitConditionsSource
Bulk Modulus(K)2 entries
89.26
GPa—
↳
88.02
GPa—
Poisson's Ratio(ν)
0.2600
-—
Shear Modulus(G)2 entries
50.02
GPa—
↳
52.61
GPa—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
4.195
kg/m³—
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
1.400
eV—
↳
0.9410
eV—
Dielectric Constant (Relative Permittivity)(εr)2 entries
16.71
-—
↳
17.77
range 17.59–17.95median of 2 measurements
-—
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-—
Total Dielectric Tensor(ε)
Matrix (redacted)
-—
Magnetic Moment(μB)
0.000
µB—
Seebeck Coefficient(S)
-251.2
µV/K—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.000
eV/atom—
Formation Energy(ΔHf)
-0.1239
eV/atom—
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.