CdSiO3
semiconductor· CdSiO3
Cadmium silicate (CdSiO3) is an inorganic semiconductor compound combining cadmium and silicate chemistry, typically studied as a thin-film or polycrystalline material for optoelectronic applications. While primarily a research material rather than a commodity engineering material, CdSiO3 has potential in photovoltaic devices, photodetectors, and luminescent applications due to cadmium's strong light-absorption properties and its compatibility with silicon-based processing. Engineers consider it where bandgap engineering or UV-to-visible light conversion is critical, though cadmium toxicity and regulatory restrictions limit deployment compared to cadmium-free alternatives like CdZnS or perovskite semiconductors.
thin-film photovoltaics (research)photodetectors and sensorsoptoelectronic devicesluminescent coatingsbandgap engineeringsemiconductor research
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 238.4 | GPa | — | ||
Poisson's Ratio(ν) | 0.3000 | - | — | ||
Shear Modulus(G) | 127.8 | GPa | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 6.627 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 0.000 | eV | — | ||
| ↳ | 2.700 | eV | — | ||
| ↳ | 0.7800 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr) | 29.73 | - | — | ||
Magnetic Moment(μB)2 entries | -0.0000309 | μB | — | ||
| ↳ | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -83.35 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.3194 | eV/atom | — | ||
Formation Energy(ΔHf)4 entries | -2.094 | eV/atom | — | ||
| ↳ | 0.4600 | eV/atom | — | ||
| ↳ | -2.465 | eV/atom | — | ||
| ↳ | -1.929 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.