Cadmium silicate (CdSiO3) is an inorganic semiconductor compound combining cadmium and silicate chemistry, typically studied as a thin-film or polycrystalline material for optoelectronic applications. While primarily a research material rather than a commodity engineering material, CdSiO3 has potential in photovoltaic devices, photodetectors, and luminescent applications due to cadmium's strong light-absorption properties and its compatibility with silicon-based processing. Engineers consider it where bandgap engineering or UV-to-visible light conversion is critical, though cadmium toxicity and regulatory restrictions limit deployment compared to cadmium-free alternatives like CdZnS or perovskite semiconductors.
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| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 238.4 | GPa | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.3000 | - | DFT · OptB88vdW | ||
Shear Modulus(G) | 127.8 | GPa | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 6.627 | kg/m³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)4 entries | 0.7800 | eV | DFT · OptB88vdW | ||
| ↳ | 3.425 | eV | DFT · TBmBJ | ||
| ↳ | 0.000 | eV | DFT · PBE | ||
| ↳ | 2.700 | eV | DFT · GLLB-SC | ||
Dielectric Constant (Relative Permittivity)(εr) | 29.73 | - | DFT · OptB88vdW | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 4.337 | - | DFT · OptB88vdW | ||
| ↳ | 3.238 | - | DFT · TBmBJ | ||
Electron Effective Mass(m*e) | 0.2900 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 1.090 | me | DFT · OptB88vdW · 27°C | ||
Magnetic Moment(μB)2 entries | -0.0000309 | μB | DFT | ||
| ↳ | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | DFT · OptB88vdW | ||
Thermoelectric Power Factor(PF)2 entries | 0.000569 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00307 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -83.35 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 367.8 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 1.580 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.3194 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf)4 entries | -2.094 | eV/atom | DFT | ||
| ↳ | 0.4600 | eV/atom | DFT | ||
| ↳ | -1.929 | eV/atom | DFT · OptB88vdW | ||
| ↳ | -2.465 | eV/atom | Measured |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data