Cadmium iodide (CdI₂) is a layered semiconductor compound belonging to the II-VI chalcogenide family, characterized by a layered crystal structure that enables mechanical exfoliation into two-dimensional materials. While primarily investigated in research settings for optoelectronic and quantum applications, CdI₂ is notably used in radiation detection systems, photovoltaic research, and as a precursor material for manufacturing specialized optical components. Engineers consider CdI₂ when designing high-sensitivity detectors, exploring van der Waals heterostructures, or developing next-generation thin-film devices where its layered nature and semiconducting properties offer advantages over bulk alternatives.
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| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 19.49 | GPa | DFT · OptB88vdW | ||
Exfoliation Energy(Eexf) | 84.26 | meV/atom | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.2900 | - | DFT · OptB88vdW | ||
Shear Modulus(G) | 9.370 | GPa | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 5.562 | kg/m³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 3.800 | eV | Measured | ||
| ↳ | 2.119 | eV | DFT · OptB88vdW | ||
| ↳ | 3.362 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 13.65 | - | DFT · OptB88vdW | ||
| ↳ | 10.70 | - | DFT · PBE | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 5.949 | - | DFT · OptB88vdW | ||
| ↳ | 4.504 | - | DFT · TBmBJ | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | DFT · PBE | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | DFT · PBE | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij)2 entries | 0.01566 | C/m² | DFT · OptB88vdW | ||
| ↳ | 0.00612 | C/m² | DFT · PBE | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | DFT · PBE | ||
Thermoelectric Power Factor(PF)2 entries | 0.00213 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00143 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -196.6 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 426.2 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 1.930 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf)2 entries | -0.5815 | eV/atom | DFT · OptB88vdW | ||
| ↳ | -0.7055 | eV/atom | Measured |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data