CdI2
semiconductor· CdI2
Cadmium iodide (CdI₂) is a layered semiconductor compound belonging to the II-VI chalcogenide family, characterized by a layered crystal structure that enables mechanical exfoliation into two-dimensional materials. While primarily investigated in research settings for optoelectronic and quantum applications, CdI₂ is notably used in radiation detection systems, photovoltaic research, and as a precursor material for manufacturing specialized optical components. Engineers consider CdI₂ when designing high-sensitivity detectors, exploring van der Waals heterostructures, or developing next-generation thin-film devices where its layered nature and semiconducting properties offer advantages over bulk alternatives.
radiation detection systemstwo-dimensional materials researchoptoelectronic devicesphotovoltaic prototypingthin-film semiconductorsquantum material platforms
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 19.49 | GPa | — | ||
Exfoliation Energy(Eexf) | 84.26 | meV/atom | — | ||
Poisson's Ratio(ν) | 0.2900 | - | — | ||
Shear Modulus(G) | 9.370 | GPa | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 5.562 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.800 | eV | — | ||
| ↳ | 2.119 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 10.70 | - | — | ||
| ↳ | 13.65 | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.00612 | C/m² | — | ||
| ↳ | 0.01566 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -196.6 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -0.7055 | eV/atom | — | ||
| ↳ | -0.5815 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.