BI3
ceramic· BI3
BI3 is a ceramic compound belonging to the bismuth-based oxide or chalcogenide family, notable for its layered crystal structure as indicated by its relatively low exfoliation energy. This material is primarily of research interest for applications requiring lightweight ceramic performance, particularly in contexts where layered materials offer advantages for electron transport, thermal management, or structural applications. BI3 represents an emerging class of ceramics being investigated for next-generation electronics, photonics, and energy storage devices where its anisotropic properties from layer stacking could be leveraged.
research and development materialssemiconductor device substratesthermoelectric applicationsenergy storage electrodesphotonic componentslightweight structural composites
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 8.330 | GPa | — | ||
Exfoliation Energy(Eexf) | 154.5 | meV/atom | — | ||
Poisson's Ratio(ν) | 0.2300 | - | — | ||
Shear Modulus(G) | 5.700 | GPa | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 4.263 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 2.651 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 2.940 | - | — | ||
| ↳ | 4.764 | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -339.7 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.00780 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.02499 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.