AlAgO2
semiconductor· AlAgO2
AlAgO2 is a mixed-metal oxide semiconductor combining aluminum and silver oxides, representing a compound of interest primarily in materials research rather than established industrial production. This material belongs to the family of transparent conducting oxides and wide-bandgap semiconductors, with potential applications where combined optical transparency and electrical conductivity are needed. While not yet widely deployed in commercial products, AlAgO2 is investigated for specialized optoelectronic and thin-film device applications where the unique properties of silver-doped aluminum oxide systems could offer advantages over single-component alternatives.
transparent conducting filmsoptoelectronic researchthin-film semiconductorsexperimental photovoltaicssensor developmentmaterials research
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 154.0 | GPa | — | ||
| ↳ | 166.8 | GPa | — | ||
Poisson's Ratio(ν) | 0.3300 | - | — | ||
Shear Modulus(G)2 entries | 60.14 | GPa | — | ||
| ↳ | 86.89 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 6.153 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.600 | eV | — | ||
| ↳ | 1.666 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 10.73 | - | — | ||
| ↳ | 11.33 | - | — | ||
| ↳ | 8.295 range 5.983–10.61median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -140.1 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -2.193 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.